電子標籤靈敏度測試 Tag Sensitivity Test: 
執行超高頻電子標籤靈敏度測試 (Tag Sensitivity or Threshold) 或最小起動功率量測時 (Tag Minimum Turn on Power)，座標X軸固定為掃瞄頻率 (Sweep Frequency)，標準掃瞄頻寬是860 MHz 至 960 MHz。座標Y軸可依客戶需求選擇以下9種顯示單位:
■ Transmitted Power (dBm)                           ■ Power on Tag Forward (dBm)       
■ Backscattered Power (dBm)                       ■ Power on Tag Reverse (dBm)
■ Backscattered Signal Phase (deg)                  ■ Theoretical Read Range Forward (M)
■ Electric Field Strength (V/m)                       ■ Theoretical Read Range Reverse (M)  
■ DeltaRCS (dBsqm) 

電子標籤反射訊號測試 Tag Backscatter Test:     
執行電子標籤反射訊號強度測試，客戶需先指定一固定量測頻率，後選取一項 X 軸單位和一項 Y 軸單位做量測。  
座標X軸共有3項量測單位:                                    座標Y軸共有5項量測單位:
1. Transmitted Power (dBm)                                1. Backscattered Power (dBm)
2. Electric Field Strength (V/m)                            2. Backscattered Signal Phase (deg)
3. Power on Tag Forward (dBm)                           3. DeltaRCS (dBsqm)
                                                                         4. Power on Tag Reverse (dBm)
                                                                         5. Theoretical Read Range Reverse (M)

電子標籤場型測試 Tag Radiation Pattern Test:
執行電子標籤2D場型測試，客戶需先指定一固定量測頻率，後選取一量測單位進行測試，量測單位共有8 種:
■ Transmitted Power (dBm)                                       ■ Power on Tag Reverse (dBm)
■ Backscattered Power (dBm)                                   ■ Theoretical Read Range Forward (M)
■ Electric Field Strength (V/m)                                   ■ Theoretical Read Range Reverse (M)
■ Power on Tag Forward (dBm)                                                ■ Normalized Radiation Pattern (dB)